Product

Nanjing Zhiqun Optoelectronic Technology Co., Ltd., relying on national scientific research project support and in cooperation with Nanjing University of Science and Technology, has successfully developed a series of 3D morphology measuring instruments based on the principle of white light microscopy interferometry, including white light microscopy interferometers and dynamic roughness measuring instruments. This series of instruments features an interference microscope objective with independent intellectual property rights and a Chinese operating interface. It has high stability, strong reliability, and easy operation, with a vertical resolution of better than 0.1nm and a horizontal resolution of up to 0.5 μ m. The product has been successfully applied in universities, defense institutes, and metrology departments, with technical indicators reaching the international level of similar products, and can replace imports; Among them, the near-infrared micro interferometer is unique in China, effectively solving the "bottleneck" problem in the field of micro nano structure detection.